Micius Academy / For engineers
AI for yield analysis
From a wafer map to a ranked list of causes, with an agent doing the investigation.
What you will learn
- Module 1Patterns on a wafer map
Edge rings, scratches, clusters and what each usually means.
- Module 2Setting up a read-only agent
Connecting MES and SPC data safely.
- Module 3Hypotheses and evidence
Asking the agent to argue for and against each cause.
- Module 4Knowing when to stop
Checkpoints, approvals and handing the decision back.
